CS 257 - Articles on Decoders for Undifferentiated NWs
Readings for Lecture 06
Some of these readings are restricted to Brown University.
Addressing Undifferentiated Nanowires
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Nanowire Addressing with Randomized-Contact Decoders
by Eric Rachlin and John E. Savage,
Procs. IEEI/ACM Int. Conf. on Computer-Aided Desing (ICCAD),
, 2006.
Abstract
Methods for assembling crossbars from nanowires
(NWs) have been designed and implemented. Methods for controlling
individual NWs within a crossbar have also been proposed,
but implementation remains a challenge. A NW decoder
is a device that controls many NWs with a much smaller
number of lithographically produced mesoscale wires (MWs).
Unlike traditional demultiplexers, all proposed NW decoders are
assembled stochastically. In a randomized-contact decoder (RCD)
[11], for example, field-effect transistors are randomly created at
about half of the NW/MW junctions.
In this paper, we tightly bound the number of MWs required
to produce a correctly functioning RCD with high probability.
We show that the number of MWs is logarithmic in the number
of NWs, even when errors occur. We also analyze the overhead
associated with controlling a stochastically assembled decoder.
As we explain, lithographically-produced control circuitry must
store information regarding whichMWs control which NWs. This
requires more area than the MWs themselves, but has received
little attention elsewhere.
Survey Article
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Nanowire-Based Programmable Architectures
by Andre' DeHon
ACM J. on Emerging Technologies in Computing Systems,
Vol. 1, No. 2, pp. 109–162, (2005)
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Abstract Chemists can now construct wires which are just a few
atoms in diameter; these wires can be selectively field-effect gated,
and wire crossings can act as diodes with programmable
resistance. These new capabilities present both opportunities and
challenges for constructing nanoscale computing systems. The tiny
feature sizes offer a path to economically scale down to atomic
dimensions. However, the associated bottom-up synthesis techniques
only produce highly regular structures and come with high defect rates
and minimal control during assembly. To exploit these technologies, we
develop nanowire-based architectures which can bridge between
lithographic and atomic-scale feature sizes and tolerate defective and
stochastic assembly of regular arrays to deliver high density
universal computing devices. Using 10nm pitch nanowires, these
nanowire-based programmable architectures offer one to two orders of
magnitude greater mapped-logic density than defect-free lithographic
FPGAs at 22nm.
Errors in Crossbars
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Nanowire-Based Programmable Architectures
by Helia Naeimi and André DeHon
Proceedings of the International Conference on Field-Programmable Technology (ICFPT2004)
pp. 49-56, December 6-8, (2004)
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Abstract Recent developments suggest both plausible fabrication
techniques and viable architectures for building sublithographic
Programmable Logic Arrays using molecular-scale wires and
switches. Designs at this scale will see much higher defect rates than
in conventional lithography. However, these defects need not be an
impediment to programmable logic design as this scale. We introduce a
strategy for tolerating defective crosspoints and develop a
lineartime, greedy algorithm for mapping PLA logic around crosspoint
defects. We note that P-term fanin must be bounded to guarantee low
overhead mapping and develop analytical guidelines for bounding
fanin. We further quantify analytical and empirical mapping overhead
rates. Including fanin bounding, our greedy mapping algorithm maps a
large set of benchmark designs with 13% average overhead for random
junction defect rates as high as 20%.
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Addressing in the Face of Uncertainty,
by Eric Rachlin and John E Savage
Proceedings of the IEEE 2006 Int. Symp. on VLSI ,
pp. 225-230, March 2-3, 2006.
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Abstract
Exploiting the high-potential of nanoscale architectures
requires that they be controlled by CMOS technology. Such
an interface, a decoder, must control many nanowires
(NWs) with a small number of meso-scale wires (MWs).
Multiple types of decoder have been proposed, each of
which can be modelled as embedding resistive switches in
NWs. In this paper we present a general model for NW decoders
and use it to specify the criteria they must meet to
function correctly and be fault-tolerant. To illustrate the
power of our model, we derive the first bounds on the size
of a fault-tolerant randomized contact decoder.